Arrangement for measuring directions or angles of deflected bundles of rays

摘要

The invention relates to an arrangement for measuring directions or angles of deflected bundles of rays in locations where the radiation itself cannot be measured for safety reasons or is not suitable for measurement, for example because it is too weak. Application for example also in engineering geodesy (engineering survey) and in general for scanning image fields by means of rays. A second ray is guided as measuring beam via the optical deflection element, for example mirrors, prisms, wedges, and is thus subjected to the same deflection as the primary bundle of rays and directly provides the measured values by means of a detector arrangement, for example a CCD line. <IMAGE>