发明名称 VIBRATION TESTER FOR DIODE
摘要 PURPOSE:To reduce power consumption with a smaller size of the apparatus, by applying vibration while a glass tube of a diode is supported with a soft elastic body on the top of a base plate to reduce the capacity of a vibration generating source. CONSTITUTION:A plurality of diodes 1 are placed side by side on the top of a base plate 10 and two probe receiving bodies 12 and then, a probe holder 13 is lowered to bring probes 5 into contact with a lead 1l. Then, a vibrator 14 is lowered to contact a glass tube 1a and a vibration is applied to the vibrator 14. With such an arrangement, as the glass tube 1a of each diode 1 is supported with a soft elastic body 11, the glass tube 1a can be given a vibration. Under such a condition, a current is applied between leads 1b of each diode 1 to check for the flowing state of the current therebetween thereby enabling a vibration test.
申请公布号 JPS63113369(A) 申请公布日期 1988.05.18
申请号 JP19860259302 申请日期 1986.10.30
申请人 ROHM CO LTD 发明人 MURAKAMI KAZUO
分类号 H01L21/66;G01R31/18;G01R31/26 主分类号 H01L21/66
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