| 摘要 |
PURPOSE:To reduce the cost required in the measurement of the contamination of an insulator, in an apparatus irradiating the insulator with ultraviolet rays to receive the reflected light from said insulator, by operating the reflectivity ratio of received lights to the different wavelength of ultraviolet rays to compare the same with that of a normal insulator. CONSTITUTION:The ultraviolet rays from a light source 1 are allowed to pass through a modulator 3 to be separated into ultraviolet rays and disturbance light to irradiate an insulator 4. The reflected light from the insulator 4 is received by a semipermeable mirror 6 and the transmitted light from said mirror 6 is allowed to pass through a filter 7 to be received by a light receiver 9 and the reflected light therefrom is allowed to pass through a filter 8 to be received by a light receiver 10. Wavelength lambda0, lambda1 of ultraviolet rays are received by the filters 7, 8 and converted to electric signals corresponding to the reception of light by the light receivers 9, 10 to be sent to amplifiers 11, 12. Said electric signals are further sent to an arithmetic processor 13 to operate the ratio I0/I1 of light receiving intensities and the reflectivity ratio of the received lights is compared with that of a normal insulator to measure the degree of contamination. Since the reflectivity ratio of the different wavelengths of ultraviolet rays is calculated, the contamination of the actually used insulator can be measured from a long distance and measuring cost can be reduced. |
