Method for allocating the activity of contaminated or activated components and materials and arrangement for carrying out the method

摘要

The invention relates to a method for determining the radiation activity of contaminated components by means of detectors, the measurement values of which are processed in a computer and indicated. From the predetermined parameters, the current and error-oriented threshold contamination SK or threshold pulse rate SI is continuously determined as the measuring time advances and compared with the actually present measurement value of the specific surface activity or mass-specific activity KO and, respectively, pulse rate IO.