Semiconducteur integrated circuit device having a tester circuit.

摘要

A semiconductor integrated circuit device formed in a single chip includes a logic circuit (10) formed by a plurality of combination circuits and a sequence circuit; and an oscillator circuit (17) receiving an external control signal during a test and generating a clock signal having a predetermined repetitive frequency. The device also includes a pulse signal generator circuit (14) receiving the clock signal and producing a plurality of test pulse signals having different timings and producing a strobe signal at a predetermined time period; a gate circuit (11) fetching the plurality of test pulse signal in response to incoming test pattern data from an external source in synchronization with the strobe signal and supplying the test pulse signals to the logic circuit; and a register circuit (15) retaining a plurality of output signals of the logic circuit receiving the test pulse signals and outputting the test pulse signals externally as output data.