| 摘要 |
A contact element for test boards, for testing test devices which serve electrical or electronic items under test. It has a metallic shaft which can be mounted on the test board, a curved, metallic bending spring which is arranged firmly on this shaft, and a metallic needle which is arranged firmly on the bending spring. In order to reduce or alleviate the risk of the bending spring fracturing, that region of the bending spring which produces, or essentially produces, the springing of the needle (which is welded on or soldered on or is formed by a tapered region or an extension which is integral with the bending spring) has at least one curve which acts with the springing.
|
