| 摘要 |
<p>In circuit testers, notably automatic test equipment for the in circuit testing of digital devices, overheating damage can result if outputs are repeatedly 'back driven', that is whilst applying a test input to a first device, an output of a second connected device is forced into a state contrary to that it would normally adopt.</p><p>The present invention provides a solution to the problem of damage by enforcing a cooling interval between backdriving test based upon a list of parameters representative of the backdriven device. In order to reduce the overall test time, a parameter is based on a measurement derived from a circuit of the type under test, and another on a subsequent backdriving test.</p><p>A first test might result in device heating to a value 51 (Fig 5). A cooling interval τcoolp is enforced so that a subsequent test (resulting in heating to 54) may be made without exceeding device maximum allowable temperature Tmax.</p> |
