发明名称 CONTACT DEVICE OF IC TEST HANDLER
摘要 PURPOSE:To eliminate fine adjustment at the time of assembly and make working on parts easy by providing contacts facing respective leads, a pair of contacts, a pair of pushing members, a pair of guides, a plurality of links and a driving means. CONSTITUTION:Contactors 3a facing respective leads 1a on both sides of an IC 1 aligned on a rail 2, a pair of contacts 3 whose contactors 3a are contacted electrically with the respective leads 1a when the IC 1 is inclined, a pair of pushing members 12 which can push the contacts 3 toward the leads 1a of the IC 1, a pair of guides 13 which are so arranged as to move freely along the linear direction of the rail 2, a plurality of links 14 which connect the respective guides 13 and the respective pushing members 12 and a driving means 9a which drives toward the contacts 3a are provided. The pushing members are displaced toward the contacts 3 and the leads 1a on the two sides of the IC are contacted with the contactors of a pair of the contacts 3 to make electrical continuity. With this constitution, fine adjustment at the time of assembly can be eliminated and working on the parts can be easy and wear of the contacts 3 can be avoided and pushing pressure can be easily regulated.
申请公布号 JPS62209837(A) 申请公布日期 1987.09.16
申请号 JP19860051930 申请日期 1986.03.10
申请人 MITSUBISHI ELECTRIC CORP 发明人 MISHIMA YOSHIYUKI;YAMAZAKI HIDETAKA
分类号 H01L21/66;G01R31/26 主分类号 H01L21/66
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