| 摘要 |
PURPOSE:To enhance the sensitivity of detection, by placing the tip of a sampling nozzle in that of a plasma torch. CONSTITUTION:The tip of a sampling nozzle 5' is placed in that (that of an outermost chamber 1a, strictly speaking) of a plasma torch 1 so that ions in plasma 4 are pulled out of the central portion of the plasma into a skimmer 12 through the sampling nozzle. The ions pulled into the skimmer 12 are detected by a pole 17. After a signal resulting from the detection is amplified by a secondary electron multiplier 20, the signal is sent to a signal processing section 21 so that the analyzed value or the like of a measured element or the like contained in a sample is finally given.
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