| 摘要 |
PURPOSE:To eliminate unnecessary readout access to a storage device and to improve the throughput of a processor by enquiring test operation for a test and set area in the storage device by the processor. CONSTITUTION:Arithmetic units 30 of processors 3a-3n read instructions out of their local storage units 31 at a time and perform operation corresponding the instructions, and data common among the processors 3a-3n are stored in a main storage device. The test and set area is provided in the device 1 so as to prevent contention of the processors in reading or writing the common data in the device 1. The test and set area is read firstly to test whether or not other processors use the device, and when the device is free, its device number is registered and an in-use display is set at the same time. Then, the common data in the device 1 are read out or written and the in-use display set in the test and set area is reset after the operation. |
