发明名称 MANUFACTURE OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To improve the variation of a boundary state by the formation of a protective film by forming a passivation protecting film and then heat treating in H2 atmosphere. CONSTITUTION:A charge transfer type solid image sensor is covered with phosphorus glass laminated by a CVD method and a passivation protective film 6 by nitrided glass. Then, it is heat treated at 400 deg.C in clean atmosphere containing 5% of H2 for 30min. The difference of a dark current due to the difference of structures under the film 6 can be removed by this treatment, the dark current level of the entire element can be lowered, thereby improving the deterioration in the characteristics due to the dark current.
申请公布号 JPS6066826(A) 申请公布日期 1985.04.17
申请号 JP19830175467 申请日期 1983.09.22
申请人 MATSUSHITA DENSHI KOGYO KK 发明人 HORII SAKAKI;KURODA TAKAO
分类号 H01L27/148;H01L21/31;H01L21/314;H01L21/316;H01L21/324;H01L27/14 主分类号 H01L27/148
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