发明名称 |
MANUFACTURE OF SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE:To improve the variation of a boundary state by the formation of a protective film by forming a passivation protecting film and then heat treating in H2 atmosphere. CONSTITUTION:A charge transfer type solid image sensor is covered with phosphorus glass laminated by a CVD method and a passivation protective film 6 by nitrided glass. Then, it is heat treated at 400 deg.C in clean atmosphere containing 5% of H2 for 30min. The difference of a dark current due to the difference of structures under the film 6 can be removed by this treatment, the dark current level of the entire element can be lowered, thereby improving the deterioration in the characteristics due to the dark current. |
申请公布号 |
JPS6066826(A) |
申请公布日期 |
1985.04.17 |
申请号 |
JP19830175467 |
申请日期 |
1983.09.22 |
申请人 |
MATSUSHITA DENSHI KOGYO KK |
发明人 |
HORII SAKAKI;KURODA TAKAO |
分类号 |
H01L27/148;H01L21/31;H01L21/314;H01L21/316;H01L21/324;H01L27/14 |
主分类号 |
H01L27/148 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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