| 摘要 |
PURPOSE:To enable the conventional functional test to be performed using a cheap clock pulse transmitter by a method wherein a changeover circuit from the data output signal from a first ROM to the logic circuit signal (b), a comparison circuit to detect the coincidence of the data output signal from a second ROM with the logic circuit output signal (c) as well as a ROM address counter 16 designating the first and the second ROM addresses are provided. CONSTITUTION:A function test actuates a change-over circuit 12 so that a logic circuit input signal (b) normally inputted to a logic circuit 11 may be changed-over by a change-over signal (a) to connect a data output signal from an input signal transmitting ROM 13 to the input of the logic circuit 11. Then one pulse of count signal (d) is transmitted later to check the coincidence checking signal (f) of a comparison circuit 15 and determines that any non- coincidence checking signal to be detective. Furthermore, if the signal agrees with said checking signal (f), next one pulse is transmitted to repeat the judgement. Through these procedures, the functional test of logic circuit 11 is judged to be acceptable when all judgements on combination of signals for the tests are complete and found coincident. |
