Method for test generation.

摘要

A method for providing test vectors adapted to test very large scale integrated circuit devices includes the steps of measuring testability employing a test counting procedure to provide a plurality of test count matrices. Sensitivity values are then enumerated by driving individual sensitivity values forwardly and rearwardly through the circuit, starting at the input terminals, until the test counts are accumulated. The enumerations define test vectors capable of testing the actual circuit. If the circuit includes reconvergent fanout loops, then these loops are enumerated first to provide partial solutions adopted during subsequent global enumeration.