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发明名称
IC TESTING APPARATUS
摘要
申请公布号
JPS6296871(A)
申请公布日期
1987.05.06
申请号
JP19850237866
申请日期
1985.10.24
申请人
HITACHI ELECTRONICS ENG CO LTD
发明人
IWAGAMI KOYO
分类号
G01R31/26;G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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