Fault test apparatus for conductors of multiconductor cable

摘要

Two parallel chains of resistances of like value are coupled between a pair of terminals to which a test voltage is applied. One chain is formed by connecting each cable conductor between a different pair of resistances in alternating serial fashion. A plurality of comparators each compare the potentials at nodes between pairs of corresponding resistances in each chain. The outputs of the comparators are coupled to a NAND gate for giving a fault indication when the output of one of more comparators changes state in response to one or more sensed faults.