发明名称 ANNEALING PROCESS OF GAAS WAFER
摘要 PURPOSE:To obtain sufficient effect for preventing wafer surface from being roughened with less flow rate of AsH3 by using solid GaAs placed at upstream side of a GaAs wafer as catalyst for decomposing AsH3. CONSTITUTION:Solid GaAs 5 mounted on a supporting base 6 is placed at the upstream side of a GaAs wafer 1 which is set on a wafer supporting base 2 in a reaction tube 3. Said GaAs wafer 1 is annealed in the atmosphere of gas stream contg. a constitutional element of the wafer 1 or a compd. of the constitution element (e.g. AsH3). Thermal decomposition of gaseous AsH3 intro duced into the reaction tube 3 is accelerated by the solid GaAs 5, so higher As pressure than conventional process exerts on the surface of the GaAs wafer 1. Therefore, elimination of As atoms from the surface of the wafer 1 is retarded. Thus, roughening of the wafer surface and deterioration of characteristics of an ion implanted layer are prevented.
申请公布号 JPS61286292(A) 申请公布日期 1986.12.16
申请号 JP19850124296 申请日期 1985.06.10
申请人 AGENCY OF IND SCIENCE & TECHNOL 发明人 ITO KAZUHIKO;YANO NORIYUKI
分类号 C30B29/42;C30B1/02;C30B33/02;H01L21/324 主分类号 C30B29/42
代理机构 代理人
主权项
地址