LOW-VOLTAGE CIRCUIT TEST AND CLAMPING DEVICE FOR MEASUREMENT,申请号JP19860109731-传众专利搜索

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发明名称	LOW-VOLTAGE CIRCUIT TEST AND CLAMPING DEVICE FOR MEASUREMENT
摘要
申请公布号	JPS61271465(A)	申请公布日期	1986.12.01
申请号	JP19860109731	申请日期	1986.05.15
申请人	MARK TECHNIC AG	发明人	HANSU PEETAA SAUDAA
分类号	G01R1/06;G01R1/067;H01R11/22	主分类号	G01R1/06
代理机构		代理人
主权项
地址

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