发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To prevent the damage of storage information without almost change in charge amount stored in a capacitor even if electron and hole pair are generated by forming a recess on the surface of a semiconductor substrate, accumulating an insulating film and the first conductive type semiconductor layer on the inner surface of the recess to form the capacitor, thereby emitting an alpha- ray in the substrate incident thereto. CONSTITUTION:A recess is formed on the surface of a silicon single crystal substrate 1, and an insulating film 3 is grown on the surface of the substrate 1 and on the inner surface in the recess. Then, the first N<+> type polycrystalline silicon layer 4, a P-type polycrystalline silicon layer 5, the second N<+> type polycrystalline silicon layer 6 are sequentially acumulated on the surface of the film 3. Then, the films 3 to be removed in the recess and the layer 4-6 are removed. Then, after a thermal oxide film 7 is grown on the surface exposed with the surface side of the substrate of the layers 4-6, the layers 4, 6 are used as source and drain regions, a polycrystalline silicon film 8 to serve as a gate electrode is accumulated on the film 7 so that the portion adjacent to the film 7 is used as a channel region to form an MOS transistor, phosphorus is diffused therein, and the desired shape is formed.
申请公布号 JPS61259564(A) 申请公布日期 1986.11.17
申请号 JP19850101938 申请日期 1985.05.14
申请人 TOSHIBA CORP 发明人 TANAKA TAKESHI
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
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