发明名称 METHOD FOR TESTING RESIN SEALED ELECTRIC PARTS
摘要 PURPOSE:To impart stress made more increased by applying the expansion stress generated in an interior other than the expansion or contraction stress of a resin from the outside, by applying hygroscopic treatment to electric parts before applying heat treatment thererto. CONSTITUTION:A semiconductor apparatus 2 is introduced into a pressure test apparatus 1 to be hermetically sealed therein. A water tank 3 is received in the pressure test apparatus 1 and a heater 4 is heated to form a saturated steam state and water is penetrated into the seal resin of the semiconductor apparatus 2. Because steam pressure changes by temp., a hygroscopic amount can be changed by setting temp. and a time. After hygroscopic treatment, the semiconductor apparatus 2 is immersed in a high temp. solder tank to repeat heat treatment many times and severe stress can be applied to the semiconductor apparatus from the inside and outside.
申请公布号 JPS61259181(A) 申请公布日期 1986.11.17
申请号 JP19850102050 申请日期 1985.05.13
申请人 MATSUSHITA ELECTRONICS CORP 发明人 YOKOYAMA MICHIYO
分类号 G01R31/26 主分类号 G01R31/26
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