| 摘要 |
PURPOSE:To make it possible to supply pattern data of different kind to any pin or a group of pins by reading data code of a pattern selecting memory from a test sequence controller. CONSTITUTION:A data code that gives instruction as to which test pattern is to be selected and given to a pin or a group of pins of a device to be tested is constituted of 13 bits, D0-D12, and the data code is stored beforehand in a pin memory 6 in a module section 17 corresponding to each pin. The data code is read out according to the order programmed beforehand for each test cycle by the mode address generated by a test sequence controller 3. Then, a test pattern designated by the data code is selected by pattern selectors 7-10, and it becomes possible to allot to corresponding pin or group of pins at optional test cycle without dummy cycle.
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