发明名称 SYSTEM FOR DETECTING FLAW ON SURFACE OF OBJECT HAVING REGULAR REFLECTION CHARACTERISTIC
摘要 PURPOSE:To make it possible to detect the presence of the flaw on the surface of mirror surface matter of a flaw such as gentle bending, by making it possible to adapt an illuminance difference stereoscopic system to an object having regular reflection characteristics. CONSTITUTION:An image data input apparatus 10 is equipped with at least three light sources P1-P3, an irregular reflective surface 11 and a TV camera 12 and matter 13 is arranged in said apparatus 10. At first, known shape matter has regular reflection characteristics is arranged in the image data input apparatus 10 and a reference table expressing the relation between the set of an observed density value and the direction of the minute surface element of the surface of the aforementioned matter 13 is formed and held to a holding means. Next, with respect to matter to be inspected having regular reflection characteristics, the reference table holding means is referred by the set of the observed density value to extract the direction of the minute surface element of the surface of the object to be inspected. The flaw on the surface of the matter is detected on the basis of the extracted direction of the minute surface element.
申请公布号 JPS61213753(A) 申请公布日期 1986.09.22
申请号 JP19850057077 申请日期 1985.03.20
申请人 AGENCY OF IND SCIENCE & TECHNOL;FUJITSU LTD 发明人 IKEUCHI KATSUSHI;OSADA SHIGEMI
分类号 G01N21/88;G01B11/30;G06K9/20;G06T1/00;H04N7/18 主分类号 G01N21/88
代理机构 代理人
主权项
地址