,申请号JP19810198015-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称
摘要
申请公布号	JPS6140650(B2)	申请公布日期	1986.09.10
申请号	JP19810198015	申请日期	1981.12.09
申请人	KUREHA CHEMICAL IND CO LTD	发明人	MAEDA JUJI;YAMATO HIDEYUKI;FUJII TAKAMI;KOBAYASHI YASUHIKO;SAITO KENICHI;KATO TADAAKI;YOSHIKUMI CHIKAO
分类号	A61K31/59;A61P1/04	主分类号	A61K31/59
代理机构		代理人
主权项
地址

您可能感兴趣的专利

IMPURITY REMOVAL METHOD FOR HEAVY METAL MEASURING SAMPLE, IMPURITY REMOVING AGENT, AND MEASURING METHOD OF HEAVY METAL

UNIT PIXEL INCLUDING PHOTON-REFRACTING MICROLENS, BACK-SIDE ILLUMINATION CMOS IMAGE SENSOR INCLUDING THE SAME, AND METHOD OF FORMING THE UNIT PIXEL

METHOD FOR ESTIMATING AMOUNT OF IMMOBILIZED PROBE AND USE THEREOF

DUAL CLUTCH TYPE AUTOMATIC TRANSMISSION

METHOD FOR PRODUCING ORGANOPOLYSILOXANE COMPOUND

HIGHLY DURABLE POLARIZING PLATE PROVIDED WITH LAYER OBTAINED FROM POLYMERIZABLE RESIN COMPOSITION

METHOD OF AUTHENTICATING TERMINAL, PROGRAM, AND TERMINAL DEVICE

OXIDE SUPERCONDUCTIVE CURRENT LEAD

METHOD FOR NMR SPECTROMETRY OR MRI MEASUREMENT USING DISSOLUTION DYNAMIC NUCLEAR POLARIZATION (DNP) WITH SCAVENGING OF FREE RADICALS

IMAGE FORMING DEVICE

SUPERCONDUCTING MAGNET

WAVELENGTH SELECTION SWITCH

IMAGE FORMING APPARATUS AND IMAGE FORMING METHOD

VARIOUS ENERGY CONSERVATION CYCLE COMBINED ENGINE

INFORMATION PROCESSING SYSTEM

CELL FOR TESTING MICROBEADS AND METHOD OF ANALYZING MICROBEADS

SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD FOR THE SEMICONDUCTOR SUBSTRATE

MAGNETORESISTANCE EVALUATION DEVICE