| 摘要 |
PURPOSE:To make possible automatic adjustment by applying a DC voltage between two electrodes on the diagonal lines of two square semiconductor plates disposed in a measuring sample position and X-ray detector position to form a Wheatstone bridge and using the current flowing between the electrodes on the other diagonal lines as a control signal for a driving device. CONSTITUTION:The square semiconductor 22 is attached, perpendicularly to an X-ray beam, to a supporting part 13 of a head of a goniometer 11. The X-ray beam is irradiated to the plate 22 and a DC voltage 27 is impressed to lead wires 23, 25. A sample stage 17 is moved in directions x, z by the driving device 18 so as to minimize the current flowing in the lead wires 24, 26. The X-ray beam is thereby positioned to the center of the plate 22 and thereafter the plate 22 is removed and a sample crystal is attached to the same position. The semiconductor plate 28 is attached to a supporting part 20 of a detector stage 19 and is irradiated with the X-ray beam emitted from the sample. The stage 19 is moved in the directions x', z' so as to minimize the current flowing in the lead wires 30, 32.
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