发明名称 LIGHT APPLYING TEMPERATURE MEASURING INSTRUMENT
摘要 PURPOSE:To make no errors caused at temp. measuring time by inserting the spacer thicker than detecting element in parallel to light detecting element between light waveguide path so that no force is given on detecting elements even in case of the gap of light waveguide path is changed. CONSTITUTION:The cylindrical spacer 4 having larger thickness than that of detecting element 3 is inserted in parallel to the photo detector 3 between the light waveguide path 1a, 1b being fixed with bonding to ferrule 2a, 2b and the detecting element 3 is fixed with bonding to the center inner part thereof. Even in the case of the gap between both light waveguide pathes 1a, 1b of the gap between the ferrule 2a, 2b being changed at the thermal expansion and shrinkage times of the ferrules 2a, 2b based on the assembly time of detecting part 7 and temp. variation the force is applied on the spacer 4 only and no direct force is applied on the detecting element 3. The effect due to the assembly time and temp. variation is thus eliminated and errors are not caused at the temp. measuring time.
申请公布号 JPS61144539(A) 申请公布日期 1986.07.02
申请号 JP19840266600 申请日期 1984.12.18
申请人 MITSUBISHI ELECTRIC CORP 发明人 TANAKA HISAO
分类号 G01J5/58;G01K11/12 主分类号 G01J5/58
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