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发明名称
X-ray spectrometer/defraction analyser
摘要
By exchanging or combining the modules of the X-ray spectrometers and X-ray defraction analysers, it becomes possible to use one X-ray apparatus to carry out sequential or simultaneous X-ray fluorescence analyses and X-ray defraction analyses.
申请公布号
DE3438637(A1)
申请公布日期
1986.05.15
申请号
DE19843438637
申请日期
1984.10.22
申请人
SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN, DE
发明人
KRAEFT, UWE, DIPL.-MIN., 6906 LEIMEN, DE
分类号
G01N23/207;G01N23/223;(IPC1-7):G01N23/223;G05G1/00;G01N23/20
主分类号
G01N23/207
代理机构
代理人
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