| 摘要 |
PURPOSE:To measure the lattice constant of a monocrystal with high accuracy, by independently and simultaneously performing the adjustment of the side-dump angle of a specimen crystal to a monochrometer with respect to a standard specimen and a specimen to be measured. CONSTITUTION:The side-dump angle of a specimen to be measured is determined by the pitches of a metal fitting 17, a spring material 18 and a screw 19 and the adjustment of the side-dump angles of a monochrometer 5 and a standard specimen is performed by a screw 16. In the degree of parallelization of the monochrometer 5 and specimen crystals 10, 11, a place, where diffraction intensities from the specimen crystals 10, 11 become max., is set as parallelism and adjustment is performed by screws 16, 19. By this method, the side-dump angle adjustment of the standard specimen 10 and the specimen 11 to be measured is simultaneously enabled and an error due to the non-adjustment of the side-dump angle can be reduced to 10<-4> or less and the measurement of lattice constant can be performed with accuracy of 10<-6>-10<-8> as DELTAalpha/d. |
