发明名称 |
Optical method for integrated circuit bar identification |
摘要 |
A method for optically marking selected integrated circuit bars of visual identification. In one embodiment a layer for photosensitive material applied to a portion of all of the bars on a wafer prior to testing. Selected bars are marked by directing a beam of radiant energy at the photosensitive material, which changes opacity and/or color in the irradiated region.
|
申请公布号 |
US4572886(A) |
申请公布日期 |
1986.02.25 |
申请号 |
US19830548545 |
申请日期 |
1983.11.03 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
REID, LEE R. |
分类号 |
B28D5/00;B41M5/26;G03F7/00;H01L23/544;(IPC1-7):G03C5/36;H01L21/66 |
主分类号 |
B28D5/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|