发明名称 EQUIPMENT INSPECTING DEVICE
摘要 PURPOSE:To perform a non-destructive inspection of an equipment accurately, by a pattern matching between a reference pattern obtained by analyzing a normal sound of the equipment and an input pattern. CONSTITUTION:A signal converted from an equipment sound with an equipment sound input section 10 is converted to an input pattern A as time series of a feature vector via a frequency analysis with an analysis section 20 to be held into buffer 30. In the learning mode, a pattern matching section 50 performs a pattern matching between the input pattern A and a reference pattern B<n> from a reference pattern memory 40. Then, the minimum of the distance value is sent to a decision section 70 for each category to be registered as reference pattern. In the monitor mode, a decision section 80 determines whether it is normal or abnormal from the minimum of each distance value by a pattern matching between the input pattern A and the reference pattern B<n>. Thus, non-destructive inspection can be done accurately and automatically.
申请公布号 JPS6134461(A) 申请公布日期 1986.02.18
申请号 JP19840156138 申请日期 1984.07.26
申请人 NEC CORP 发明人 OKAMURA HIROHIKO
分类号 G10L11/00;G01N29/12;G01N29/22;G06T1/00;G10L15/10 主分类号 G10L11/00
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