发明名称 |
LOGIC/ARRAY TESTER |
摘要 |
A test system for testing circuits in integrated circuit chips includes a host computer for controlling the test system, and a plurality of blocks operable in parallel and each including a controller, storage for test programs and test data, and plurality of electronic units or pin electronics cards, one unit being associated with one of the pins of a device under test. Each of the electronic units include timing circuitry for timing its associated pin independent of the timing of any other electronics unit. |
申请公布号 |
DE3267552(D1) |
申请公布日期 |
1986.01.02 |
申请号 |
DE19823267552 |
申请日期 |
1982.06.02 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
GRAF, MATTHEW CHRISTOPHER;MUHLFELD, HANS PETER, JR.;VALENTINE, EDWARD HUBERT |
分类号 |
G01R31/26;G01R31/28;G01R31/319;H01L21/66;(IPC1-7):G01R31/28;G06F11/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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