| 摘要 |
PURPOSE:To obtain data having high reliability of a vibration test by applying an exciting waveform produced by reducing the gain of a target waveform to a vibrating table for an advanced test and calculating a transmission function from said exciting waveform for correction of a waveform. CONSTITUTION:A test piece is attached to a vibrating table 2 of a vibration tester and vibrated with a target waveform. A waveform corrector contains a waveform memory 4, a Fourier transform means 14 and a power calculation means 24. The memory 4 contains a target waveform memory 6 storing a target waveform, an exciting waveform memory 8 for advanced test of an exciting waveform obtained by reducing the gain of said target waveform, an answer waveform memory 10 and a memory 12 for waveform obtained by correcting the target waveform. When a target waveform is corrected, the exciting waveform for advanced test is applied to the table 2 via an A/D converter 48. In this case, an answer waveform is stored to the memory 10. Then a transmission function is calculated 32 via the means 14 and the means 24 and stored to the memory 12 together with a calculated 44 correction spectrum. |
