| 摘要 |
AUTOMATIC FAULT-PROBING METHOD AND APPARATUS FOR CHECKING ELECTRICAL CIRCUITS AND THE LIKE This disclosure is concerned with a novel method and apparatus peripherally and interactively used with automatic fault detecting computer systems and the like, wherein external control is provided for introducing intelligence into the probing of circuit board nodes and the like where insights into predictable or likely failures are available and the over-riding or discontinuing of normal computer-guided time-consuming back-tracking probing is thus desirable. |
