| 摘要 |
PURPOSE:To attain optimum offset correction without lossing high pressure resistance and high speed by interrupting sampling at a previously set-up period and finding out the difference between each input and a stored offset value. CONSTITUTION:Prior to data collection at the running of a plasma testing device, the offset value between an insulating amplifier 3 and a signal input device 4 is found out and stored in each channel. An electronic computer 8 starts a clocking means on the basis of a data collection starting signal 10, applies sampling interruption to a data sampling means at the previously set-up period and stops the clocking means by a data collection stopping signal 11 to stop sampling interruption. Subsequently, a data sampling means, an offset correcting means and a correction data holding means find out the difference between an input value obtained by successively inputting signals 1-n from the plasma testing device 1 through a signal input device 4 in each smapling interruption an the offset value and store the corrected data.
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