发明名称 CHATTERING TESTER
摘要 PURPOSE:To grasp and classify a characteristic of a switch by measuring each time in the course of chattering in a prescribed period. CONSTITUTION:This tester is provided with a clock oscillator 1 for determining a basic cycle of an operation, register groups R0-R3 which are provided in a CPU2 and consist of a stability confirming register to which a duration of an off-state of a switch is inputted, and a register to which a duration of on-and-off states generated successively is inputted, and a circuit 6 for detecting a state of a switch 7 to be inspected. In this state, whenever the switch 7 becomes an off- state by a program of an ROM4, a duration of the off-state is inputted to the stability confirming register, whether a stable time is elapsed or not is decided, the state of the switch 7 is stored in other register before the stable time elapses, and when it is confirmed that the stable time is passed, the maximum time of the on-and-off states of a storage time of other register is outputted, and the maximum on-off duration before the switch is stabilized is measured.
申请公布号 JPS60142275(A) 申请公布日期 1985.07.27
申请号 JP19830247245 申请日期 1983.12.29
申请人 NIKOKU KIKAI KOGYO KK 发明人 IKEDA AKIO;WATANABE MASAO
分类号 G01R31/00;H03K5/01;H03K5/1254 主分类号 G01R31/00
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