发明名称 |
Phantom for measuring slice thicknesses, slice sensitivity profiles and the axial modulation transfer function in an X-ray computed tomography apparatus |
摘要 |
A phantom for measuring slice thicknesses, slice sensitivity profiles and the axial modulation transfer function in an X-ray computed tomography apparatus contains a foil of a material that highly attenuates X-radiation that is arranged parallel to the image plane of the X-ray computed tomography apparatus given employment of the phantom and which had an axial expanse that is small compared to the thinnest slice to be measured. The expanse of the foil in the direction of the image plane is on the order of magnitude of a few millimeters.
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申请公布号 |
US6490336(B1) |
申请公布日期 |
2002.12.03 |
申请号 |
US20010831543 |
申请日期 |
2001.07.23 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
SUESS CHRISTOPH;KALENDER WILLI |
分类号 |
A61B6/03;A61B6/00;(IPC1-7):A61B6/00 |
主分类号 |
A61B6/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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