| 摘要 |
In a method for disturbance-free examination of surface defects a solution with one or more dyes is first applied, which essentially has no emission under UV light, the excess solution is removed after the dye has penetrated into the surface defects, whereupon the surface is covered with a developer, which leaves behind an absorbing coating rich in contrast in daylight, said developer exclusively having one or more optical brighteners in an amount between 0.02 and 2.0 wt%. The coating absorbs the dye from the surface defect, which is revealed under UV light as a black trace on the coating. |
