发明名称 Apparatus for projecting a series of images onto dies of a semiconductor wafer.
摘要 <p>A unit magnification, achromatic, anastigmatic optical projection system, more particularly for microlithography on semi-conductor wafers, comprises a concave mirror (52), an achromatic lens (56) including a meniscus lens (53), a plano-convex lens (55) and two reflecting prisms (56, 57), all with appropriate refraction indices. Light which has passed through a recticle (R) is reflected by prism (56), then by mirror (52) and thereafter by prism (57) toward a wafer (W). Mirror (52) has an aperture (58) through which a beam of light is directed towards a photomultiplier tube (66) which is thus used to align wafer (W) with respect to reticle (R). </p>
申请公布号 EP0146670(A2) 申请公布日期 1985.07.03
申请号 EP19840104552 申请日期 1982.05.17
申请人 GENERAL SIGNAL CORPORATION 发明人 HERSHEL, RONALD S.;LEE, MARTIN B.
分类号 G03B27/42;G02B13/24;G02B17/08;G03B27/32;G03B27/34;G03F7/20;G03F9/00;H01L21/027;H01L21/30;(IPC1-7):G03B41/00 主分类号 G03B27/42
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