发明名称 PROFILE MEASURING APPARATUS
摘要 PURPOSE:To measure the cross-sectional profile of a plate rapidly, by simple constitution such that two sets of moving type thickness meters are arranged on the same straight line of an object to be measured in the plate width direction thereof to determine the deviation of a thickness measuring signal and a set value and operating a profile pattern on the basis of the deviation at the central part. CONSTITUTION:Two sets of moving type thickness meters 11, 12 are arranged on the same straight line of a plate body 10 to be measured such as a rolled material in the plate width direction thereof and the deviation of the thickness measuring signal due to the thickness meter 11 moving to the width direction and a set value is stored in a memory apparatus 13A and the deviation at the central part of the plate body 10 is stored in a memory apparatus 13B. Subsequently, similar deviations are stored in the apparatuses 13A, 13B respectively through the thickness meter 11 and the moving thickness meter 12 and cross-sectional profile of the plate body 10 is operated and determined on the basis of the deviation at the central part by an operation apparatus 14. By this mechanism, the correction of a distance becomes unnecessary and the moving amount of the thickness meter comes to almost 1/2 of the plate width and the cross-sectional profile of the plate body can be measured rapidly inclusive of a stop state by simple constitution.
申请公布号 JPS60111905(A) 申请公布日期 1985.06.18
申请号 JP19830219713 申请日期 1983.11.22
申请人 TOSHIBA KK 发明人 SATOU SHIGEO;HIRAGA TATSU
分类号 G01B15/02;G01B11/24;G01B21/20 主分类号 G01B15/02
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