发明名称 DYNAMIC-RANDOM-ACCESS-MEMORY
摘要 PURPOSE:To shorten signal retardation time, and to obtain a three transistor type dynamic RAM, the speed of operation thereof is fast, by sharing the specific sections of connecting sections among two word lines of wirting and reading, two bit lines of writing and reading and an MOSFET for writing, reading and memory in an RAM cell consisting of these lines and MOSFET. CONSTITUTION:A junction section 3-1 between a reading bit line 6-1 (RB) and a diffusion layer 2 and a junction section 3-2 between a writing bit line 6-2 (WB) and the diffusion layer 2 are each arranged to two sides opposed when one cell takes a quadrilateral. Consequently, two FET elements which have not operated logically are removed, and capacitance attached to each word line 1-1 and 1-2 is reduced to approximately half. Wiring width except gate section in FET elements in several word line is widened partially as a call area is left as it is, its resistance is lowered, and the speed of operation is increased. The capacitance of each word line is also reduced to approximately half or two third at the same time, and the signal retardation time of the word lines is shortened.
申请公布号 JPS6095963(A) 申请公布日期 1985.05.29
申请号 JP19830203976 申请日期 1983.10.31
申请人 NIPPON DENKI KK 发明人 HOSHI TOSHIAKI
分类号 G11C11/405;H01L21/8234;H01L21/8242;H01L27/088;H01L27/10;H01L27/108 主分类号 G11C11/405
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