| 摘要 |
PURPOSE:To enable the measurement of hardness even if a generated indentation is not actually measured through a microscope by a measuring operator, by providing a half mirror arranged in close vicinity to the tip of an indenter so as to be positioned on the surface crossing the movement direction of the indenter at right angles interlocking with said indenter. CONSTITUTION:The indenter attaching shaft 2 having an indenter 1 secured to the leading end thereof is constituted so as to be movable up and down in a direction vertical to the surface 5 of a specimen and can press the indenter to the surface S of the specimen under load corresponding to the wt. of a pressure wt. 3. A half mirror 4 for an interferometer interlocking with the indenter attaching shaft 2 is provided on the surface crossing the operation direction of the indenter attaching shaft 2 at right angles in close vicinity to the tip of the indenter. In addition, a semiconductor laser 5 is provided above the half mirror 4 for the interferometer and irradiates laser beam to the half mirror 4 for the interferometer from a vertical direction. The hardness of a specimen is calculated even if an indentation is not actually measured through a microscope by a measuring operator. |
