发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form a Bi-MOS semiconductor device by a simplified process, by making semiconductor layers for MOS circuit elements to be thin at the same time when grooves for inter-element separation at bipolar circuit elements are formed, or when semiconductor layers at an I<2>L circuit element part are made to be thin. CONSTITUTION:Grooves 100, which are used for inter-element separation at a bipolar transistor part 1,000, are also composed at a n-channel MOS transistor part 3000 so that a source-drain 9, gate 10, and substrate-takeout area 7, for the n-channel MOS transistor, are formed on the bottom surface of the grooves 100. A P-type island area 20, which electrically conducts to a P-type semiconductor substrate 1, is also formed below the grooves 100. That is, with the grooves 100, which are for inter-element separation, being shared at the n-channel MOS transistor part 3000, an epitaxial layer 4 is made to be thin by the depth of the grooves 100 so as to facilitate an electrical connection of the P-type island area 20 to the P-type substrate 1, and not to cause the number of the process to be increased.
申请公布号 JPS61244059(A) 申请公布日期 1986.10.30
申请号 JP19850084640 申请日期 1985.04.22
申请人 HITACHI LTD 发明人 WASHIO KATSUYOSHI;OKADA YUTAKA;OKABE TAKAHIRO
分类号 H01L27/082;H01L21/8222;H01L21/8249;H01L27/02;H01L27/06 主分类号 H01L27/082
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