| 摘要 |
PURPOSE:To achieve a highly accurate timing test for an IC containing an oscillator and an IC using an external clock by providing a means of converting a basic clock signal oscillated from an oscillator into a basic clock signal of a high frequency. CONSTITUTION:This is composed of an oscillator 2100 for generating a basic clock 116, a rate generator 2200 for generating a test synchronous signal 107 receiving the basic clock 116, a timing selection signal 106 and a control signal 117 as input, a phase clock generator 2300 for outputting a clock signal 110 synchronizing the test synchronous signal 107 receiving the basic clock 116 and the test synchronous signal 107 as input and a phase generator 114 for outputting a timing signal 114 receiving the clock signal or the like as input. Then, depending on whether the IC to be tested is an oscillator-built-in type or not, the test synchronous signal 107 and the timing signal 114 are outputted according to the IC being tested. |
