发明名称 |
PLANAR TYPE SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To enhance the withstand voltage of a semiconductor device without losing characteristics such as a switching velocity, a saturable characteristic and reverse withstand voltage by increasing the controlling margin of a boundary charge density of a semiconductor substrate. CONSTITUTION:The entire surface of a semiconductor substrate is covered with the first film 16 and the second film 17. The film 16 is formed of a semi-insulating film having 7 or more of dielectric constant such as a polysilicon carbide. The film 17 is formed of an insulating film having large diffusion blocking ability of contaminating ion nuclide having 7 or more of dielectric constant such as Al2O3. Since a leakage electric field can be effectively shielded by providing the above first and second films and an electric field produced in a semiconductor substrate 1 can be shared in the first and second films, the concentration of the electric field on the surface of the junction can be effectively alleviated. |
申请公布号 |
JPS59194441(A) |
申请公布日期 |
1984.11.05 |
申请号 |
JP19830068369 |
申请日期 |
1983.04.20 |
申请人 |
TOSHIBA KK |
发明人 |
KAI SHIYUNICHI;YASUDA SEIJI;USUKI KIICHI;TAKIMOTO KAZUHIRO |
分类号 |
H01L21/314;(IPC1-7):H01L21/314 |
主分类号 |
H01L21/314 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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