发明名称 PLANAR TYPE SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enhance the withstand voltage of a semiconductor device without losing characteristics such as a switching velocity, a saturable characteristic and reverse withstand voltage by increasing the controlling margin of a boundary charge density of a semiconductor substrate. CONSTITUTION:The entire surface of a semiconductor substrate is covered with the first film 16 and the second film 17. The film 16 is formed of a semi-insulating film having 7 or more of dielectric constant such as a polysilicon carbide. The film 17 is formed of an insulating film having large diffusion blocking ability of contaminating ion nuclide having 7 or more of dielectric constant such as Al2O3. Since a leakage electric field can be effectively shielded by providing the above first and second films and an electric field produced in a semiconductor substrate 1 can be shared in the first and second films, the concentration of the electric field on the surface of the junction can be effectively alleviated.
申请公布号 JPS59194441(A) 申请公布日期 1984.11.05
申请号 JP19830068369 申请日期 1983.04.20
申请人 TOSHIBA KK 发明人 KAI SHIYUNICHI;YASUDA SEIJI;USUKI KIICHI;TAKIMOTO KAZUHIRO
分类号 H01L21/314;(IPC1-7):H01L21/314 主分类号 H01L21/314
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