发明名称 |
DEVICE FOR X-RAY FLUORESCENCE ANALYSIS |
摘要 |
In apparatus for x-ray fluorescence analysis in which x-ray fluorescence radiation is excited in a specimen, in order to obtain simultaneous coverage of fluorescence radiation of different wavelengths even from inhomogeneous specimens, the source for the radiation to be analyzed is made point shaped or line shaped, the source is located at the focus of a parabolically curved analyzer crystal, the lattice planes of which are parallel to its surface, and a position sensitive detector is arranged with its axis perpendicular to the parabola axis of the parabolic analyzer crystal, opposite the analyzer crystal. |
申请公布号 |
EP0021253(B1) |
申请公布日期 |
1984.10.03 |
申请号 |
EP19800103253 |
申请日期 |
1980.06.11 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
WEICHERT, NORBERT, DR. DIPL.-PHYS |
分类号 |
G01N23/223;(IPC1-7):01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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