发明名称 DEFECT DETECTING METHOD AND DEVICE
摘要 <p>In a defect detecting method and device, an image formed by receiving light from an illuminated object to be examined, is divided into a plurality of picture elements, and the signals of the picture elements are stored. The signals are later read out in the order in which the portions of the object corresponding respectively to the picture elements are traversed by a substantially spiral imaginary line drawn on said object, and a defect is detected from the relationship between the signal of one of the picture elements and the signal of another picture element read out a little before the reading of the signal of said one of the picture elements.</p>
申请公布号 CA1175139(A) 申请公布日期 1984.09.25
申请号 CA19810380646 申请日期 1981.06.26
申请人 KIRIN BEER KABUSHIKI KAISHA 发明人 MIYAZAWA, TAKASHI
分类号 G01N21/90;(IPC1-7):G01N21/90 主分类号 G01N21/90
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