发明名称 SEMICONDUCTOR PHOTO DETECTING ELEMENT
摘要 PURPOSE:To obtain an APD of low noise wherein the rate of ionization is increased sufficiently by a method wherein the first semiconductor layer having a thickness less than a specific value and the second conductor layer having a forbidden band width larger than the thickness and a thickness less than a specific value are laminated alternately by double layer and more respectively. CONSTITUTION:When the thicknesses of GaAs layers 1 and Al0.5Ca0.5As layers 2 which have forbidden band widths Eg1 and Eg2 respectively and are laminated alternately are 300Angstrom or less and 200Angstrom or less respectively, the thickness of each layer 1 and 2 becomes approximately equal to the de Broglie wavelength of the electron. Electrons concentrated to a GaAs potential well layer 1 come to permeate through the Al0.5Ga0.5As layer 2 by tunnel effect, and accordingly quantized electron energy bands 3 and 4 are formed over each layer 1 and 2. The band doscontinuity on the side of a valence band is sufficiently small, and the interval of the energy band of formed holes is very small, therefore the interval can be approximated to the valence band of a bulk. Besides, this constitution makes the rate of electron ionization become much smaller than the rate of hole ionization.
申请公布号 JPS59132687(A) 申请公布日期 1984.07.30
申请号 JP19830007876 申请日期 1983.01.20
申请人 NIPPON DENKI KK 发明人 TORIKAI TOSHITAKA
分类号 H01L31/0352;H01L31/107 主分类号 H01L31/0352
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