发明名称 CMOS integrated logic circuit secured against overvoltages appearing on the substrate.
摘要 The invention relates to integrated circuits, and more particularly to CMOS technology circuits in which transistors T1 are formed directly in the substrate 10 and complementary transistors T2 are in compartments 12 with opposite conductivity type. When the circuit incorporates non-volatile memory elements, overvoltages appear on the substrate during the writing to or erasure of memory and which modify the threshold voltages of the transistors which are not inside the compartments. There are then provided in parallel with these transistors T1 a pair of transistors T3, T4 in series, the one controlled by the same voltage as the relevant transistor T1 and the other by a voltage W indicating the presence of an overvoltage on the substrate. <IMAGE>
申请公布号 FR2538619(A1) 申请公布日期 1984.06.29
申请号 FR19820021863 申请日期 1982.12.28
申请人 EFCIS 发明人 SYLVAIN KRITTER ET DANIEL VELLOU;VELLOU DANIEL
分类号 H01L27/02;H01L27/092;(IPC1-7):H01L27/06 主分类号 H01L27/02
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