发明名称 METHOD AND DEVICE FOR MEASURING POSITION
摘要 A process and apparatus for obtaining harmonic-free periodic signals in an incremental measuring system is disclosed in which a graduation having a graduation period P is scanned by at least six scanning elements (for the case in which the previously determined bandwidth N of the analog signals obtained in scanning the graduation N is equal to 3). The periodic analog signals generated by the scanning elements are subjected to a Fourier analysis for the determination of the Fourier coefficients of the base or fundamental wave of the periodic analog signals. These Fourier coefficients are then evaluated as harmonic-free periodic signals for the formation of position measuring values.
申请公布号 JPS5994012(A) 申请公布日期 1984.05.30
申请号 JP19830196283 申请日期 1983.10.21
申请人 DOKUTORU YOHANESU HAIDENHAIN 发明人 ARUFUONSU SHIYUPIISU
分类号 G01B11/00;G01B21/00;G01D5/244;G01D5/347;G01D5/36;G01R23/167;H03M1/00 主分类号 G01B11/00
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