发明名称 |
METHOD AND DEVICE FOR MEASURING POSITION |
摘要 |
A process and apparatus for obtaining harmonic-free periodic signals in an incremental measuring system is disclosed in which a graduation having a graduation period P is scanned by at least six scanning elements (for the case in which the previously determined bandwidth N of the analog signals obtained in scanning the graduation N is equal to 3). The periodic analog signals generated by the scanning elements are subjected to a Fourier analysis for the determination of the Fourier coefficients of the base or fundamental wave of the periodic analog signals. These Fourier coefficients are then evaluated as harmonic-free periodic signals for the formation of position measuring values. |
申请公布号 |
JPS5994012(A) |
申请公布日期 |
1984.05.30 |
申请号 |
JP19830196283 |
申请日期 |
1983.10.21 |
申请人 |
DOKUTORU YOHANESU HAIDENHAIN |
发明人 |
ARUFUONSU SHIYUPIISU |
分类号 |
G01B11/00;G01B21/00;G01D5/244;G01D5/347;G01D5/36;G01R23/167;H03M1/00 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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