发明名称 ELECTRODE WIRING METHOD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enable to form electrode wirings in a multilayer type without generating disconnection at step parts by a method wherein a metal layer and a resin layer are formed in order on the whole surface from the upper part of grooves formed in a layer of phosphorus silicate glass, etc., and plasma etching is performed in succession from the upper part thereof to remove the metal layer on the insulator layers. CONSTITUTION:A second insulator layer 3 is formed on a semiconductor substrate 2 having a first insulator layer 1, and the grooves 4 of patterns corresponding to the parts of electrode wirings are opened. After an Al layer 5 is formed, polyimide or an organic resin material of high viscosity to be used for a photo resist is applied on the Al layer 5 thereof to form a resin layer 6. Then etching is performed from the surface of the resin layer 6 according to the plasma ions of Ar, etc., to expose the surfaces of the protruding parts 5' of the Al layer 5, and etching is proceeded moreover to expose the second insulator layers 3. Overetching is performed as it is to remove completely the protruding parts 5' of the Al layer 5, and when the resins on the Al layers 5'' are removed by oxygen plasma, the electrode wirings consisting of the Al layers 5'' having flat surface structure and surrounded by the second insulator layers 3 can be obtained.
申请公布号 JPS5982746(A) 申请公布日期 1984.05.12
申请号 JP19820192491 申请日期 1982.11.04
申请人 TOSHIBA KK 发明人 AOYAMA MASAHARU;ABE MASAYASU;YASUJIMA TAKASHI;YONEZAWA TOSHIO
分类号 H01L21/3205;H01L21/306;H01L21/768;H01L23/532 主分类号 H01L21/3205
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