发明名称 Pin arrays for automatic testers
摘要 In an adapter for simultaneously sampling contact points by means of spring-loaded contact pins, contact pins are provided which have at both ends spring contact pins which are supported on a common spring. These spring contact pins are combined in a position plate which is opposite to a pressure plate with contact pins.
申请公布号 DE3240415(A1) 申请公布日期 1984.05.03
申请号 DE19823240415 申请日期 1982.11.02
申请人 SIEMENS AG 发明人 BRABETZ,BERNHARD,DIPL.-ING.;URBAN,ZDENEK,DIPL.-ING.
分类号 G01R1/067;G01R1/073;(IPC1-7):G01R31/28 主分类号 G01R1/067
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