发明名称 |
Pin arrays for automatic testers |
摘要 |
In an adapter for simultaneously sampling contact points by means of spring-loaded contact pins, contact pins are provided which have at both ends spring contact pins which are supported on a common spring. These spring contact pins are combined in a position plate which is opposite to a pressure plate with contact pins.
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申请公布号 |
DE3240415(A1) |
申请公布日期 |
1984.05.03 |
申请号 |
DE19823240415 |
申请日期 |
1982.11.02 |
申请人 |
SIEMENS AG |
发明人 |
BRABETZ,BERNHARD,DIPL.-ING.;URBAN,ZDENEK,DIPL.-ING. |
分类号 |
G01R1/067;G01R1/073;(IPC1-7):G01R31/28 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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