发明名称 FUNCTION EVALUATING METHOD OF INTEGRATED CIRCUIT
摘要 PURPOSE:To obtain a function evaluating method which decreases the number of test sequences and facilitates a function test by comparing a test output with an expected value when converting operation in which a test output is converted into a test input different in value is repeated specific times. CONSTITUTION:The test output corresponding to a test input to a multiplying circuit 1 whose functions are to be evaluated is passed through a feedback loop control part 2 and converted by a data conversion part 3 into a value different from the last test input, and the value is fed back to the circuit 1. This repetitive test is carried out by the control part 2 until the counted value of a feedback frequency attains to a set value and the test output after the specific-time repetition is compared with an expected output obtained when similar repetition regarding a reference circuit is performed, thus performing evaluation. Therefore, even when the number of bits of the circuit to be tested increases, the number of test sequences is suppressed, and the function evaluating method which facilitates the function test is obtained.
申请公布号 JPS5931462(A) 申请公布日期 1984.02.20
申请号 JP19820141871 申请日期 1982.08.16
申请人 TOKYO SHIBAURA DENKI KK 发明人 MORI SHIYOUJIROU
分类号 G01R31/28;G01R31/317;H01L21/66 主分类号 G01R31/28
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